Soft x-ray photoelectron spectroscopy of tin-phthalocyanine/GaAs(001)-1 × 6 interface formation

Journal of Physics Condensed Matter

Volumn 15, Issue 38, 2003, Pages

  Cabailh, G ^a   Wells, J W ^a   McGovern, I T ^a   Dhanak, V R ^b,c   Vearey Roberts, A R ^d   Bushell, A ^d   Evans, D A ^d  

^a TRINITY COLLEGE DUBLIN   (Ireland)

^b UNIVERSITY OF LIVERPOOL   (United Kingdom)

^c DARESBURY LABORATORY   (United Kingdom)

^d ABERYSTWYTH UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC PROPERTIES; HETEROJUNCTIONS; INTERFACES (MATERIALS); ION BOMBARDMENT; MOLECULAR STRUCTURE; SURFACE TREATMENT; THIN FILMS; TIN COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

ARGON ION BOMBARDMENT; CORE LEVEL PHOTOEMISSION SPECTRA; INTERFACE DIPOLE; SOFT X RAY PHOTOELECTRON SPECTROSCOPY; TIN PHTHALOCYANINE;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0141982916     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/38/012     Document Type: Article

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