In-situ monitoring of the growth of copper phthalocyanine films on InSb by organic molecular beam deposition

Applied Surface Science

Volumn 175-176, Issue , 2001, Pages 374-378

  Evans, D A ^a   Steiner, H J ^a   Middleton, R ^b   Jones, T S ^b   Chen, C H ^c   Horn, K ^c   Park, S ^d   Kampen, T U ^d   Tenne, D ^d   Zahn, D R T ^d   Patchett, A ^e   McGovern, I T ^e  

^a ABERYSTWYTH UNIVERSITY   (United Kingdom)

^b IMPERIAL COLLEGE LONDON   (United Kingdom)

^c FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^d CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

^e TRINITY COLLEGE DUBLIN   (Ireland)

Author keywords

Interface; Phthalocyanine; Spectroscopy

Indexed keywords

BINDING ENERGY; FILM GROWTH; INTERFACES (MATERIALS); LOW ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; RAMAN SPECTROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; SUBSTRATES; SYNCHROTRON RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

ORGANIC MOLECULAR BEAM DEPOSITION (OMBD); SOFT X-RAY PHOTOELECTRON SPECTROSCOPY (SXPS);

SEMICONDUCTING FILMS;

EID: 0035873336     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00073-3     Document Type: Article

References (18)

1. Forrest S.R. Chem. Rev. 97:1997;1793.
2. Baldo M., Thompson M.E., Forrest S.R. Nature. 403:2000;750.
3. Basova T.V., Kolesov B.A. Thin Solid Films. 325:1998;140.
4. Hill I.G., Kahn A. J. Appl. Phys. 86:1999;2116.
5. Cox J.J., Bayliss S.M., Jones T.S. Surf. Sci. 425:1999;326.
6. Cox J.J., Jones T.S. Surf. Sci. 457:2000;311.
7. Drews D., Sahm J., Richter W., Zahn D.R.T. J. Appl. Phys. 78:1995;4060.
8. Mackey K.J., Zahn D.R.T., Allen P.M.G., Williams R.H., Richter W., Williams R.S. J. Vac. Sci. Technol. B5:1987;12223.
9. Olsson L.Ö., Ilver L., Kanski J., Nilsson P.O., Andersson C.B.M., Karlsson U.O., Hakansson M.C. Phys. Rev. B. 53:1996;4734.
10. Hirose Y., Forrest S.R., Kahn A. Phys. Rev. B. 52:1995;14040.
11. Park S., Kampen T.U., Braun W., Zahn D.R.T. Appl. Phys. Lett. 76:2000;3200.
12. Hirose Y., Chen W., Haskal E.I., Forrest S.R., Kahn A. Appl. Phys. Lett. 64:1994;3482.
13. Stenzel O., Stendal A., Drews D., Werninghaus T., Falke M., Zahn D.R.T., von Borczyskowski C. Appl. Surf. Sci. 108:1997;71.
14. Kim J.W., Kim S., Seo J.M. Phys. Rev. B. 54:1996;4476.
15. Hill I.G., Kahn A. J. Appl. Phys. 85:1999;2116.
16. Chasse T., Wu C.-I., Hill I.G., Kahn A. J. Appl. Phys. 85:1999;6589.
17. D.A. Evans, H.J. Steiner, R. Middleton, T.S. Jones, S. Park, Th. Kampen, D.R.T. Zahn, I.T. McGovern, in preparation.
18. D.A. Evans, H.J. Steiner, D. Tenne, Th. Kampen, D.R.T. Zahn, in preparation.