PbPC growth on Si surfaces studied with XPS and various SPM techniques

Surface Science

Volumn 392, Issue 1-3, 1997, Pages 52-61

  Ottaviano, L ^a   Lozzi, L ^a   Santucci, S ^a   Di Nardo, S ^a   Passacantando, M ^a  

^a UNIVERSITY OF L'AQUILA   (Italy)

Author keywords

Atomic force microscopy; Scanning tunneling microscopy; Silicon; Surface structure, morphology, roughness, and topography; X ray photoelectron spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; MORPHOLOGY; SCANNING TUNNELING MICROSCOPY; SILICON; SUBLIMATION; SUBSTRATES; SURFACE ROUGHNESS; X RAY PHOTOELECTRON SPECTROSCOPY;

LEAD PHTHALOCYANINE;

LEAD COMPOUNDS;

EID: 0031358181     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(97)00492-5     Document Type: Article

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