Using scanning tunneling microscopy to characterize adsorbates and reactive intermediates on transition metal oxide surfaces

Catalysis Today

Volumn 85, Issue 2-4, 2003, Pages 101-111

  Altman, E I ^a   Tanner, R E ^b  

^a Yale University   (United States)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

Adsorption; Anatase; Oxide; Palladium; STM; Tungsten oxide

Indexed keywords

ADSORPTION; CATALYSIS; CRYSTAL DEFECTS; CRYSTAL LATTICES; MONOLAYERS; OXIDATION; PALLADIUM; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE; TEMPERATURE PROGRAMMED DESORPTION;

SURFACE RECONSTRUCTION;

TUNGSTEN COMPOUNDS;

EID: 0141884805     PISSN: 09205861     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0920-5861(03)00379-1     Document Type: Article

References (40)

1. Stipe B.C., Rezaei M.A., Ho W. Science. 280:1998;1732.
2. Futaba D.N., Landry J.P., Loui A., Chiang S. Phys. Rev. B. 65:2002;0451061.
3. Weiss P.S., Eigler D.M. Phys. Rev. Lett. 71:1995;3139.
4. Sprunger P., Besenbacher F., Stensgaard I. Surf. Sci. 324:1995;L321.
5. Onishi H., Fukui K.I., Iwasawa Y. Colloid Surf. A. 109:1996;335.
6. Onishi H., Fukui K.I., Iwasawa Y. Jpn. J. Appl. Phys., Part 1. 38:1999;3830.
7. Onishi H., Iwasawa Y. Jpn. J. Appl. Phys., Part 2. 33:1994;L1338.
8. Onishi H., Iwasawa Y. Chem. Phys. Lett. 226:1994;111.
9. Onishi H., Iwasawa Y. Surf. Sci. 313:1994;L783.
10. Onishi H., Iwasawa Y. Surf. Sci. 357:1996;773.
11. Nakakura C.Y., Phanse V.M., Zheng G., Bannon G., Altman E.I., Lee K.P. Rev. Sci. Instrum. 69:1998;3251.
12. Banse B.A., Koel B.E. Surf. Sci. 232:1990;275.
13. Vu D.T., Mitchell K.A.R., Warren O.L., Thiel P.A. Surf. Sci. 318:1994;129.
14. Nakakura C.Y., Zheng G., Altman E.I. Surf. Sci. 401:1998;173.
15. Zheng G., Altman E.I. Surf. Sci. 462:2000;151.
16. Jones F.H., Rawlings K., Foord J.S., Egdell R.G., Pethica J.B., Wanklyn B.M.R., Parker S.C., Oliver P.M. Surf. Sci. 359:1996;107.
17. Tanner R.E., Altman E.I. J. Vac. Sci. Technol. A. 19:2001;1502.
18. Tanner R.E., Liang Y., Altman E.I. Surf. Sci. 506:2002;251.
19. Tanner R.E., Meethunkij P., Altman E.I. J. Phys. Chem. B. 51:2000;12315.
20. Liang Y., Gan S., Chambers S.A., Altman E.I. Phys. Rev. B. 63:2001;235402.
21. Murakami M., Matsumoto Y., Nakajima K., Makino T., Segawa Y., Chikyow T., Ahmet P., Kawasaki M., Koinuma H. Appl. Phys. Lett. 78:2001;2664.
22. S.A. Chambers, C.M. Wang, S. Thevuthasan, T. Droubay, D.E. McCready, A.S. Lea, V. Shutthanandan, C.F. Windisch, Thin Solid Films 414 (2002) 197.
23. Chambers S.A., Thevuthasan S., Farrow R.D.C.et al. Appl. Phys. Lett. 79:2002;3467.
24. Herman G.S., Sievers M.R., Gao Y. Phys. Rev. Lett. 84:2000;3354.
25. Hengerer R., Bolliger B., Erbudak M., Grätzel M. Surf. Sci. 460:2000;162.
26. Kim K.S., Barteau M.A. Langmuir. 4:1988;945.
27. Kim K.S., Barteau M.A. Langmuir. 6:1990;1485.
28. Kim K.S., Barteau M.A. J. Catal. 125:1990;353.
29. Idriss H., Lusvardi V.S., Barteau M.A. Surf. Sci. 348:1996;39.
30. Tanner R.E., Altman E.I., Sasahara A., Onishi H., Liang Y. J. Phys. Chem. B. 106:2002;8211.
31. Diebold U. Surf. Sci. Rep. 48:2003;53.
32. Lazzeri M., Selloni A. Phys. Rev. Lett. 87:2001;266105.
33. Ciuparu D., Lyubovsky M.R., Altman E.I., Pfefferle L.D., Datye A. Catal. Rev. 44:2002;593.
34. Valden M., Pere J., Hirismäki M., Suhonen S., Pessa M. Surf. Sci. 377:1997;605.
35. Valden M., Pere J., Xiang N., Pessa M. Chem. Phys. Lett. 257:1996;289.
36. Zheng G., Altman E.I. Surf. Sci. 462:2000;151.
37. Zheng G., Altman E.I. Surf. Sci. 504:2002;253.
38. Zheng G., Altman E.I. J. Phys. Chem. B. 106:2002;1048.
39. Chang S.-L., Thiel P.A. J. Chem. Phys. 88:1988;2071.
40. Chang S.-L., Thiel P.A., Evans J.W. Surf. Sci. 205:1988;117.