An STM study of surface structures on WO3(001)

Surface Science

Volumn 359, Issue 1-3, 1996, Pages 107-121

  Jones, F H ^a   Rawlings, K ^a   Foord, J S ^a   Egdell, R G ^a   Pethica, J B ^b   Wanklyn, B M R ^b   Parker, S C ^c   Oliver, P M ^c  

^a New Chemistry Laboratory   (United Kingdom)

^b UNIVERSITY OF OXFORD   (United Kingdom)

^c UNIVERSITY OF BATH   (United Kingdom)

Author keywords

Low index single crystal surfaces; Scanning tunneling microscopy; Scanning tunneling spectroscopies; Surface defects; Surface structure, morphology, roughness, and topography; Tungsten oxide

Indexed keywords

ANNEALING; CRYSTAL DEFECTS; CURRENT VOLTAGE CHARACTERISTICS; ELECTRONIC DENSITY OF STATES; ELECTROSTATICS; ION BOMBARDMENT; IONS; PHASE SEPARATION; SCANNING TUNNELING MICROSCOPY; STABILITY; SURFACE STRUCTURE; SURFACES;

DEFECT TROUGHS; LOW INDEX SINGLE CRYSTAL SURFACES; MONOCLINIC; POLAR SURFACE; SUPERSTRUCTURE; SURFACE TOPOGRAPHY; TILTING; TUNGSTEN TRIOXIDE;

TUNGSTEN COMPOUNDS;

EID: 0030194199     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00302-0     Document Type: Article

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