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Volumn 120, Issue 1-2, 2003, Pages 325-338

Channel cracking during thermal cycling of thin film multi-layers

Author keywords

Creep; Cyclic temperatures; Feature size; Fracture; Multilayer; Ratcheting

Indexed keywords

CRACKS; DEFORMATION; MULTILAYERS; PLASTICITY; THERMAL CYCLING; THIN FILMS;

EID: 0141817135     PISSN: 03769429     EISSN: None     Source Type: Journal    
DOI: 10.1023/a:1024915510009     Document Type: Article
Times cited : (5)

References (13)
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    • (2002) Thin Solid Films , vol.419 , pp. 144-153
    • Ambrico, J.M.1    Begley, M.R.2
  • 3
    • 0000769923 scopus 로고    scopus 로고
    • Progressive cracking in a multi-layer system upon thermal cycling
    • Begley, M.R. and Evans, A.G. (2001). Progressive cracking in a multi-layer system upon thermal cycling. Journal of Applied Mechanics 68, 513-520.
    • (2001) Journal of Applied Mechanics , vol.68 , pp. 513-520
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  • 6
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    • Thin film cracking and ratcheting caused by temperature cycling
    • Huang, M. Suo, Z. Ma, Q., and Fujimoto, H. (2000). Thin film cracking and ratcheting caused by temperature cycling. Journal of Materials Research 15, 1239-1242.
    • (2000) Journal of Materials Research , vol.15 , pp. 1239-1242
    • Huang, M.1    Suo, Z.2    Ma, Q.3    Fujimoto, H.4
  • 7
    • 0035801936 scopus 로고    scopus 로고
    • Metal film crawling in interconnected structures caused by cyclic temperatures
    • Huang, M., Suo, Z. and Ma, Q. (2001). Metal film crawling in interconnected structures caused by cyclic temperatures. Acta Materialia 49, 3039-3049.
    • (2001) Acta Materialia , vol.49 , pp. 3039-3049
    • Huang, M.1    Suo, Z.2    Ma, Q.3
  • 10
    • 0024626558 scopus 로고
    • The cracking and decohesion of thin films on ductile substrates
    • Hu, M.S. and Evans, A.G. (1989). The cracking and decohesion of thin films on ductile substrates. Acta Metallurgica et Materialia 37, 917-925.
    • (1989) Acta Metallurgica et Materialia , vol.37 , pp. 917-925
    • Hu, M.S.1    Evans, A.G.2
  • 11
    • 0033937363 scopus 로고    scopus 로고
    • Developing design rules to avert cracking and debonding in integrated circuit structures
    • Liu, X.H., Suo, Z., Ma, Q. and Fujimoto, H. (2000). Developing design rules to avert cracking and debonding in integrated circuit structures. Engineering Fracture Mechanics 66, 387-402.
    • (2000) Engineering Fracture Mechanics , vol.66 , pp. 387-402
    • Liu, X.H.1    Suo, Z.2    Ma, Q.3    Fujimoto, H.4
  • 12
    • 0035247798 scopus 로고    scopus 로고
    • Low-dielectric constant polymers for microelectronics
    • Maier, G. (2001). Low-dielectric constant polymers for microelectronics. Progress in Polymer Science 26, 3-65.
    • (2001) Progress in Polymer Science , vol.26 , pp. 3-65
    • Maier, G.1
  • 13
    • 0035426516 scopus 로고    scopus 로고
    • Constrained diffusional creep in UHV-produced copper thin films
    • Weiss, D., Gao, H. and Arzt, E. (2001). Constrained diffusional creep in UHV-produced copper thin films. Acta Materialia 49, 2395-2403.
    • (2001) Acta Materialia , vol.49 , pp. 2395-2403
    • Weiss, D.1    Gao, H.2    Arzt, E.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.