Three-dimensional resolution enhancement in fluorescence microscopy by harmonic excitation

Optics Letters

Volumn 26, Issue 11, 2001, Pages 828-830

  Frohn, J T ^a   Knapp, H F ^a   Stemmer, A ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

HARMONIC EXCITATION LIGHT MICROSCOPY (HELM);

HARMONIC ANALYSIS; LIGHT INTERFERENCE; SIGNAL TO NOISE RATIO;

FLUORESCENCE;

EID: 0001427310     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.26.000828     Document Type: Article

References (12)

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5. M. G. L. Gustafsson, J. Microsc. 198, 82 (2000).
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8. V. Krishnamurthi, B. Bailey, and F. Lanni, Proc. SPIE 2655, 18 (1996).
9. 1 of the first image can easily be calculated from the measured fluorescence images because the original passband and the shifted copies overlap. This fact simplifies a practical 3D HELM setup because the beam deflection units are not required to maintain a fixed phase relationship during operation.
10. A. Erhardt, G. Zinser, D. Komitowski, and J. Bille, Appl. Opt. 24, 194 (1998).
11. The choice of a cosine bell apodization results in image points with negative intensities. One normalizes the traces in Figs. 2-4 by setting the most negative value to zero.
12. 2, any desired value of u can be realized by interference of two plane waves whose propagation vectors reside in lower and upper half-spaces, respectively, relative to the object plane.