Reliability and failure mechanisms of oxide VCSELs in non-hermetic environments

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4994, Issue , 2003, Pages 173-180

  Xie, Suning ^a   Herrick, Robert ^a   De Brabander, Greg ^a   Widjaja, Wilson ^a   Koelle, Uli ^a   Cheng, An Nien ^a   Giovane, Laura ^a   Hu, Frank ^a   Keever, Mark ^a   Osentowski, Tim ^a   McHugo, Scott ^a   Mayonte, Myrna ^a   Kim, Seongsin ^a   Chamberlin, Danielle ^b   Rosner, S J ^b   Girolami, Grant ^b  

^a AGILENT TECHNOLOGIES   (United States)

^b AGILENT LABORATORIES   (United States)

Author keywords

Failure mechanism; Humidity; Oxide; Reliability; VCSEL

Indexed keywords

ATMOSPHERIC HUMIDITY; FIBER OPTICS; MOISTURE; OXIDES; RELIABILITY;

ENVIRONMENTAL RELIABILITY;

LASERS;

EID: 0141791275     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.480281     Document Type: Conference Paper

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