Reliability of oxide VCSELs in non-hermetic environments

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn 2, Issue , 2002, Pages 544-545

  Xie, Suning ^a   De Brabander, Greg ^a   Widjaja, Wilson ^a   Koelle, Uli ^a   Cheng, An Nien ^a   Giovane, Laura ^a   Hu, Frank ^a   Herrick, Robert ^a   Keever, Mark ^a   Osentowski, Tim ^a  

^a AGILENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; DISLOCATIONS (CRYSTALS); FAILURE (MECHANICAL); MATHEMATICAL MODELS; RELIABILITY; TRANSMISSION ELECTRON MICROSCOPY;

DISLOCATION GROWTH; FAILURE MECHANISMS; VERTICAL CAVITY SURFACE EMITTING LASER;

SEMICONDUCTOR LASERS;

EID: 0036920361     PISSN: 10928081     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. S. Xie, M. Keever, L. Giovane, R. Herrick, U. Koelle, A.-N. Cheng, W. Widjaja, F. Hu, G. De Brabander, and T. Osentowski, "Reliability of Agilent Oxide VCSELs for 1×12 Arrays", March 2002, available at http://literature.agilent.com/litweb
2. S. Xie, G. De Brabander, W. Widjaja, U. Koelle, A.-N. Cheng, L. Giovane, F. Hu, R. Herrick, M. Keever, and T. Osentowski, "Environmental Reliability of Agilent Oxide VCSELs for 1×12 Arrays", May 2002, available at http://literature.agilent.com/litweb
3. Bellcore, GR-468-CORE, "Generic Reliability Assurance Requirements for Optoelectronic Devices Used in Telecommunications Equipment", 1998
4. M. Leary, unpublished.
5. S. Xie, R. Herrick, D. Chamberlin, S.J. Rosner, S. McHugo, G. Giolanni, M. Mayonte, S. Kim and W. Widjaja, "Failure Mode Analysis of Oxide VCSELs in High Humidity and High Temperature", submitted to IEEE/OSA Journal of Lightwave Technology.
6. P.M. Petroff, and L.C. Kimerling, "Dislocation Climb Model in Compound Semiconductors with Zinc Blende Structure", Applied Physics Letters, vol.29, pp.461-463, 1976.
7. C.H. Henry and D.V. Lang, "Nonradiative Capture and Recombination by Multiphonon Emission in GaAs and GaP", Phys. Rev. B, vol. 15, pp.989-1016, 1977.
8. R. Herrick, "Reliability of Fiber Optic Datacom Modules at Agilent Technologies", the Proceedings of 2002 IEEE Electronic Components and Technologies Conference, pp. 532-539, May 2002.
9. M. Keever, unpublished.