Reconstructions of the InP(111)A surface

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 8, 2003, Pages

  Li, H ^a   Sun, Y ^a   Law, C ^a   Visbeck, B ^a   Hicks, F ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INDIUM; PHOSPHORUS;

ARTICLE; ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; SURFACE PROPERTY; VAPOR; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0141788161     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.085320     Document Type: Article

References (30)

1. E. A. Caridi, T. Y. Chang, K. W. Goosen, and L. F. Eastman, Appl. Phys. Lett. 56, 659 (1990).
2. D. L. Smith, Solid State Commun. 57, 919 (1986);
3. D. L. Smith and C. Mailhiot, J. Appl. Phys. 63, 2717 (1988).
4. Y. Kajikawa, N. Sugiyama, T. Kamijoh, and Y. Katayama, Jpn. J. Appl. Phys., Part 2 28, L 1022 (1989).
5. D. L. Smith and C. Mailhiot, Phys. Rev. Lett. 58, 1264 (1987).
6. T. Hayakawa, T. Suyama, K. Takashashi, M. Kondo, S. Yamamoto, and T. Hijikata, Appl. Phys. Lett. 52, 339 (1988).
7. D. K. Biegelsen, R. D. Bringans, J. E. Northrup, and L.-E. Swartz, Phys. Rev. Lett. 65, 452 (1990).
8. J. M. C. Thornton, D. A. Woolf, and P. Weightman, Surf. Sci. 380, 548 (1997).
9. K. W. Haberern and M. D. Pashley, Phys. Rev. B 41, 3226 (1990).
10. J. M. C. Thornton, P. Weightman, D. A. Woolf, and C. J. Dunscombe, Phys. Rev. B 51, 14459 (1995).
11. J. M. C. Thornton, P. Weightman, D. A. Woolf, and C. J. Dunscombe, J. Electron Spectrosc. Relat. Phenom. 72, 65 (1995).
12. S. Y. Tong, G. Xu, and W. N. Mei, Phys. Rev. Lett. 52, 1693 (1984).
13. J. Bohr, R. Feidenhans’l, M. Neielsen, M. Toney, R. L. Johnson, and I. K. Robinson, Phys. Rev. Lett. 54, 1275 (1985).
14. E. Kaxiras, Y. Bar-Yam, J. D. Joannopoulos, and K. D. Pandey, Phys. Rev. B 35, 9625 (1987).
15. E. Kaxiras, Y. Bar-Yam, J. D. Joannopoulos, and K. D. Pandey, Phys. Rev. B 35, 9636 (1987).
16. L. Li, B.-K. Han, S. Gan, H. Qi, and R. F. Hicks, Surf. Sci. 398, 386 (1998).
17. D. C. Law, Y. Sun, C. H. Li, G. Chen, S. B. Visbeck, and R. F. Hicks, Phys. Rev. B 66, 045314 (2002).
18. L. C. Feldman and J. W. Mayer, Fundamentals of Surface and Thin Film Analysis (Elsevier Science, New York, 1986).
19. Y. Feurprier, Ch. Cardinaud, and G. Turban, J. Vac. Sci. Technol. B 16, 1823 (1998).
20. V. I. Nefedov, X-ray Photoelectron Spectropscopy of Solid Surfaces (VSP BV, Utrecht, 1988).
21. C. J. Powell (private communication).
22. M. D. Pashley, Phys. Rev. B 40, 10-481 (1989).
23. J. A. Dean, Lange’s Handbook of Chemistry, 15th ed. (McGraw-Hill, New York, 1999).
24. A. R. Smith, R. M. Feenstra, D. W. Greve, M. S. Shin, M. Skowronski, J. Neugebauer, and J. E. Northrup, J. Vac. Sci. Technol. B 16, 2242 (1998).
25. J. E. Northrup and J. Neugebauer, Phys. Rev. B 57, R4230 (1998).
26. L. J. Whitman, P. M. Thibado, S. C. Erwin, B. R. Bennett, and B. V. Shanabrook, Phys. Rev. Lett. 79, 693 (1997).
27. P. M. Thibado, B. R. Bennett, B. V. Shanabrook, and L. J. Whitman, J. Cryst. Growth 175, 317 (1997).
28. W. G. Schmidt, P. H. Hahn, F. Bechstedt, N. Esser, P. Vogt, A. Wange, and W. Richter, Phys. Rev. Lett. 90, 126101 (2003).
29. L. Li, B.-K. Han, Q. Fu, and R. F. Hicks, Phys. Rev. Lett. 82, 1879 (1999).
30. Q. Fu, E. Negro, G. Chen, C. H. Li, D. C. Law, R. F. Hicks, and K. Raghavachari, Phys. Rev. B 65, 75318 (2002).