Surface potential measurement of oligothiophene ultrathin films by Kelvin probe force microscopy

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 6 B, 2001, Pages 4381-4383

  Umeda, Keiichi ^a   Kobayashi, Kei ^a   Ishida, Kenji ^a   Hotta, Shu ^b   Yamada, Hirofumi ^a   Matsushige, Kazumi ^a  

^a KYOTO UNIVERSITY   (Japan)

^b PANASONIC CORPORATION   (Japan)

Author keywords

Kelvin probe force microscopy; Oligothiophene; Surface potential

Indexed keywords

DEPOSITION; ELECTRIC POTENTIAL; FILM GROWTH; FREQUENCY MODULATION; MICROSCOPIC EXAMINATION; MONOLAYERS; OLIGOMERS; SUBSTRATES; SURFACE PROPERTIES;

KELVIN PROBE FORCE MICROSCOPY; MOLECULAR FILMS; SURFACE POTENTIALS;

ULTRATHIN FILMS;

EID: 0035357978     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.4381     Document Type: Article

References (15)