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Volumn 59, Issue 23, 1999, Pages 15513-15522

Synthesis and characterization of si/cs/o nanocluster thin films with negative electron affinity

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Indexed keywords


EID: 0141657592     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.15513     Document Type: Article
Times cited : (30)

References (49)
  • 20
    • 85037877288 scopus 로고    scopus 로고
    • Due to convolution of the clusters’ dimensions with the finite radius of the AFM tip, AFM diameter measurements tended to give values that are much higher than actual values. So diameter measurement is avoided here
    • Due to convolution of the clusters’ dimensions with the finite radius of the AFM tip, AFM diameter measurements tended to give values that are much higher than actual values. So diameter measurement is avoided here.
  • 33
    • 85037921038 scopus 로고    scopus 로고
    • Under present condition in our analysis chamber, samples cannot be aligned to be satisfactorily parallel to the PEEM anode (or transfer case), hence image distortion results
    • Under present condition in our analysis chamber, samples cannot be aligned to be satisfactorily parallel to the PEEM anode (or transfer case), hence image distortion results.
  • 49
    • 85037914914 scopus 로고    scopus 로고
    • For many semiconducting nanoclusters, some special surface terminations or passivations may significantly reduce the subband gap surface-states density (for example, Si nanoclusters passivated with hydrogen)
    • For many semiconducting nanoclusters, some special surface terminations or passivations may significantly reduce the subband gap surface-states density (for example, Si nanoclusters passivated with hydrogen).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.