On the Breakdown of Universal Mobility Curves: A Brownian 3D Simulation Framework

Journal of Computational Electronics

Volumn 1, Issue 3, 2002, Pages 375-379

  Kaya, Savas ^a   Asenov, Asen ^b   Roy, Scott ^b  

^a Ohio University   (United States)

^b UNIVERSITY OF GLASGOW   (United Kingdom)

Author keywords

Brownian dynamics; device simulation; interface roughness scattering; MOSFET; universal mobility

Indexed keywords

MOSFET DEVICES;

3D SIMULATION FRAMEWORK; BROWNIAN DYNAMICS; CALIBRATION PROCEDURE; DEVICE SIMULATIONS; EFFICIENT SIMULATION; EXPONENTIAL CORRELATION; INTERFACE ROUGHNESS SCATTERING; MOS-FET;

BROWNIAN MOVEMENT;

EID: 0141637956     PISSN: 15698025     EISSN: 15728137     Source Type: Journal    
DOI: 10.1023/A:1020755709939     Document Type: Article

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