High-resolution transmission electron microscopy/analytical electron microscopy characterization of epitaxial oxide multilayers fabricated by laser ablation on biaxially textured Ni

Physica C: Superconductivity and its Applications

Volumn 321, Issue 1, 1999, Pages 29-38

  Sun, E Y ^a   Goyal, A ^a   Norton, D P ^a   Park, C ^b   Kroeger, D M ^a   Paranthaman, M ^a   Christen, D K ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b OAK RIDGE INSTITUTE FOR SCIENCE AND EDUCATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; CRYSTAL ATOMIC STRUCTURE; CRYSTAL MICROSTRUCTURE; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; HIGH TEMPERATURE SUPERCONDUCTORS; LASER ABLATION; MORPHOLOGY; MULTILAYERS; NICKEL; OXIDE SUPERCONDUCTORS; ZIRCONIA;

CERIA;

SUPERCONDUCTING FILMS;

EID: 0032641995     PISSN: 09214534     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4534(99)00342-1     Document Type: Article

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