Study of second-phases in Ba(Mg1/3Ta2/3) O3 materials by microwave near-field microscopy

Journal of the European Ceramic Society

Volumn 23, Issue 14, 2003, Pages 2667-2670

  Cheng, Hsiu Fung ^a   Chen, Yi Chun ^a   Wang, Gang ^b   Xiang, Xiao Dong ^b   Chen, Guan Yu ^c   Liu, Kuo Shung ^c   Lin, I Nan ^c  

^a NATIONAL TAIWAN NORMAL UNIVERSITY   (Taiwan)

^b Intematix Corporation   (United States)

^c NATIONAL TSING HUA UNIVERSITY   (Taiwan)

Author keywords

Ba(Mg,Ta)O3; BMT; Dielectric properties; Microwave ceramics dielectric; Near field spectroscopy; Resonators

Indexed keywords

BARIUM COMPOUNDS; COMPUTER SIMULATION; FINITE ELEMENT METHOD; MICROWAVES; PERMITTIVITY; RESONATORS;

EVANESCENT MICROWAVE PROBES (EMP);

CERAMIC MATERIALS;

CERAMICS; MICROWAVE RADIATION;

EID: 0043192396     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(03)00180-8     Document Type: Article

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