Application to dielectric, metallic, and magnetic samples of a transmission mode scanning near field optical microscope with normal force distance regulation on bent optical fibers

Review of Scientific Instruments

Volumn 70, Issue 12, 1999, Pages 4587-4594

  David, T ^a   Chicanne, C ^a   Richard, N ^a   Krenn, J R ^c   Scheurer, F ^b   Ounadjela, K ^b   Hehn, M ^b   Lacroute, Y ^a   Goudonnet, J P ^a  

^a UNIVERSITÉ DE BOURGOGNE   (France)

^b INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0043096664     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150117     Document Type: Article

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