Observation of light confinement effects with a near-field optical microscope

Physical Review Letters

Volumn 77, Issue 27, 1996, Pages 5332-5335

  Weeber, Jean Claude ^a   Bourillot, Eric ^a   Dereux, Alain ^a   Goudonnet, Jean Pierre ^a   Chen, Yong ^b   Girard, Christian ^c  

^a UNIVERSITÉ DE BOURGOGNE   (France)

^b CNRS   (France)

^c UNIVERSITÉ DE FRANCHE COMTÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

NEAR-FIELD OPTICAL IMAGES; NEAR-FIELD OPTICAL MICROSCOPES; PASSIVE ELEMENTS; SUBWAVELENGTH;

DEFECTS; LIGHT POLARIZATION; LIGHT REFLECTION; LIGHT SCATTERING; OPTICAL MICROSCOPY; SUBSTRATES; SURFACE ROUGHNESS;

OPTICS;

EID: 18144365132     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.77.5332     Document Type: Article

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