A normal force distance regulation scheme for near-field optical microscopy

Applied Physics Letters

Volumn 68, Issue 12, 1996, Pages 1607-1609

  Stephenson, R J ^a   Welland, M E ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; FORCE MEASUREMENT; FRICTION; OPTICAL DEVICES; OSCILLATIONS; PHOTOMULTIPLIERS; SPATIAL VARIABLES CONTROL; TUNGSTEN;

CANTILEVER; DISTANCE CONTROL; FIBER OPTIC PROBES; LEVERS; NEAR FIELD OPTICAL MICROSCOPE; TUNGSTEN TIP;

OPTICAL MICROSCOPY;

EID: 0030110573     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.115666     Document Type: Article

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