Characterizations of (Bi,La)Ti3O12 thin films coated on a single-crystalline Al2O3 insulation layer/Si substrate

Journal of the Korean Physical Society

Volumn 43, Issue 1, 2003, Pages 123-127

  Chang, H J ^a   Hwang, S H ^a   Chang, Y C ^b   Ishlda, M ^c  

^a Dankook University   (South Korea)

^b Korea University of Technology and Education   (South Korea)

^c TOYOHASHI UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

Ferroelectric thin film

Indexed keywords

EID: 0043071353     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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