Electric measurements of nano-scaled devices

Thin Solid Films

Volumn 438-439, Issue , 2003, Pages 462-466

  Watanabe, Hiroyuki ^a   Shimotani, Kei ^a   Shigematu, Taishi ^a   Manabe, Chikara ^a  

^a FUJI XEROX CO LTD   (Japan)

Author keywords

Atomic force microscope; Carbon nanotube; DNA; Transistor

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; ELECTRIC CONDUCTIVITY; ELECTRIC PROPERTIES; MOLECULES; NANOSTRUCTURED MATERIALS; TRANSISTORS;

MOLECULAR ELECTRONICS;

ELECTRONIC EQUIPMENT;

EID: 0043028626     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00806-X     Document Type: Conference Paper

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