Optical characterization of 4H-SiC by far ultraviolet spectroscopic ellipsometry

Applied Physics Letters

Volumn 79, Issue 2, 2001, Pages 162-164

  Lim, Seung Gu ^a   Jackson, Thomas N ^a   Mitchel, W C ^b   Bertke, R ^b   Freeouf, J L ^c  

^a PENNSYLVANIA STATE UNIVERSITY   (United States)

^b AIR FORCE RESEARCH LABORATORY   (United States)

^c Interface Studies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042884118     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1384895     Document Type: Article

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