Perceived substratum characteristics as a function of AFM probe and imaging fluid properties

Langmuir

Volumn 19, Issue 15, 2003, Pages 6151-6159

  Morrow, J B ^a   Smets, B F ^a   Grasso, D ^b  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b SMITH COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COATINGS; COLLOIDS; GLASS; HYDROPHILICITY; SUBSTRATES; SURFACE ROUGHNESS;

TOPOGRAPHY;

SURFACE CHEMISTRY;

EID: 0042843571     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0344130     Document Type: Article

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