Optical interference artifacts in contact atomic force microscopy images

Ultramicroscopy

Volumn 92, Issue 3-4, 2002, Pages 243-250

  Mendez Vilas A ^a   Gonzalez Martin M L ^a   Nuevo, M J ^a  

^a UNIVERSITY OF EXTREMADURA   (Spain)

Author keywords

Artifacts; Atomic force microscopy (AFM); Fast fourier transform (FFT); Interference fringes

Indexed keywords

FOURIER TRANSFORMS; LIGHT SCATTERING; STAINLESS STEEL; SURFACE ROUGHNESS; WAVE INTERFERENCE;

ARTIFACTS;

ATOMIC FORCE MICROSCOPY;

STAINLESS STEEL;

ARTICLE; ARTIFACT; ATOMIC FORCE MICROSCOPY; CONTROLLED STUDY; FOURIER TRANSFORMATION; IMAGE ANALYSIS; LASER; LIGHT; LIGHT SCATTERING; MICROSCOPE; MICROSCOPE IMAGE; OPTICAL INTERFERENCE; OPTICS; PHYSICAL PHENOMENA; SURFACE PROPERTY; TECHNIQUE;

ARTIFACTS; FOURIER ANALYSIS; LENSES; MICROSCOPY, ATOMIC FORCE; STAINLESS STEEL; SURFACE PROPERTIES; YEASTS;

EID: 0036288977     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(02)00140-7     Document Type: Article

References (8)