Influence of tip geometry on fractal analysis of atomic forcemicroscopy images

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Mannelquist, A ^a   Almqvist, N ^a   Fredriksson, S ^a  

^a LULEÅ UNIVERSITY OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AFM IMAGE; AFM TIP; DISTORTED IMAGES; ESTIMATED PARAMETER; FOURIER METHODS; FRACTAL ANALYSIS; FRACTAL PARAMETERS; FRACTAL SURFACES; RANDOM ALGORITHMS; SCALE-INVARIANT; STRUCTURE FUNCTIONS; SURFACE HEIGHT; TIP GEOMETRY;

FRACTAL DIMENSION; METAL FOIL;

ATOMIC FORCE MICROSCOPY;

EID: 0000688898     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051262     Document Type: Article

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