Multiplexed DNA quantification by spectroscopic shift of two microsphere cavities

Biophysical Journal

Volumn 85, Issue 3, 2003, Pages 1974-1979

  Vollmer, Frank ^a   Arnold, Stephen ^b   Braun, Dieter ^a   Teraoka, Iwao ^b   Libchaber, Albert ^a  

^a ROCKEFELLER UNIVERSITY   (United States)

^b POLYTECHNIC UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSPHERE; SILICON DIOXIDE;

ARTICLE; BIOSENSOR; COMPARATIVE STUDY; DNA DETERMINATION; DNA HYBRIDIZATION; DNA SEQUENCE; NUCLEIC ACID ANALYSIS; RELIABILITY; SEMICONDUCTOR; SEQUENCE ANALYSIS; SIGNAL NOISE RATIO; SPECTROSCOPY; SURFACE PLASMON RESONANCE; SURFACE PROPERTY;

EID: 0042823392     PISSN: 00063495     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0006-3495(03)74625-6     Document Type: Article

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