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Volumn 23, Issue 4, 2003, Pages 49-57

Generating Test Inputs for Embedded Control Systems

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; EMBEDDED SYSTEMS; GENETIC ALGORITHMS;

EID: 0042527544     PISSN: 1066033X     EISSN: None     Source Type: Journal    
DOI: 10.1109/MCS.2003.1213603     Document Type: Article
Times cited : (41)

References (25)
  • 5
    • 0030679993 scopus 로고    scopus 로고
    • Toward formalizing a validation methodology using simulation coverage
    • Anaheim, CA,.
    • A. Gupta, S. Malik, and P. Ashar, “Toward formalizing a validation methodology using simulation coverage,” in Proc. 34th Design Automation Conf., Anaheim, CA, 1997, pp. 740-745.
    • (1997) Proc. 34th Design Automation Conf. , pp. 740-745
    • Gupta, A.1    Malik, S.2    Ashar, P.3
  • 6
    • 0033353202 scopus 로고    scopus 로고
    • Efficient test set design for analog and mixed-signal circuits and systems
    • Shanghai, China,.
    • S. Huynh, J. Zhang, S. Kim, G. Devarayanadurg, and M. Soma, “Efficient test set design for analog and mixed-signal circuits and systems,” in Proc. 8th Asian Test Symp., Shanghai, China, 1999, pp. 239-244.
    • (1999) Proc. 8th Asian Test Symp. , pp. 239-244
    • Huynh, S.1    Zhang, J.2    Kim, S.3    Devarayanadurg, G.4    Soma, M.5
  • 7
    • 0032140730 scopus 로고    scopus 로고
    • What's decidable about hybrid automata
    • T. Henzinger, P.W. Kopke, A. Puri, and P. Varaiya, “What's decidable about hybrid automata,” J. Comput. Syst. Sci., vol. 57, no.1, pp. 94-124, 1998.
    • (1998) J. Comput. Syst. Sci. , vol.57 , Issue.1 , pp. 94-124
    • Henzinger, T.1    Puri, A.2    Varaiya, P.3
  • 8
    • 0033749133 scopus 로고    scopus 로고
    • Characterization of a pseudo-random testing technique for analog and mixed-signal built-in-self-test
    • Montreal, Canada,.
    • J. Tofte, C.K. Ong, J.L. Huang, and K.T. Cheng, “Characterization of a pseudo-random testing technique for analog and mixed-signal built-in-self-test,” in Proc. 18th IEEE VLSI Test Symp., Montreal, Canada, 2000, pp. 237-246.
    • (2000) Proc. 18th IEEE VLSI Test Symp. , pp. 237-246
    • Tofte, J.1    Huang, J.L.2    Cheng, K.T.3
  • 9
    • 0043285982 scopus 로고    scopus 로고
    • Toward formalizing a validation methodology using simulation coverage
    • San Jose, CA,.
    • A. Gupta, S. Malik, and P. Ashar, “Toward formalizing a validation methodology using simulation coverage,” in Proc. IEEE/ACM Int. Conf. Computer-Aided Design, San Jose, CA, 2001, pp. 286-292.
    • (2001) Proc. IEEE/ACM Int. Conf. Computer-Aided Design , pp. 286-292
    • Gupta, A.1    Malik, S.2    Ashar, P.3
  • 11
    • 0033309839 scopus 로고    scopus 로고
    • Abstracting formal specifications to generate software tests via model checking
    • St Louis, MO
    • P. Ammann and P.E. Black, “Abstracting formal specifications to generate software tests via model checking,” in Proc. 18th Digital Avionics Systems Conf. (DASC99), St Louis, MO, 1999, vol. 2, pp. 10.A.6.
    • (1999) Proc. 18th Digital Avionics Systems Conf. (DASC99) , vol.2 , pp. 10.A.6.
    • Ammann, P.1    Black, P.E.2
  • 14
    • 0002904989 scopus 로고
    • A simulation-based test generation scheme using genetic algorithms
    • Bombay, India,.
    • M. Srinivas and L. Patnaik, “A simulation-based test generation scheme using genetic algorithms,” in Proc. 6th Int. Conf. VLSI Design, Bombay, India, 1993, pp. 132-135.
    • (1993) Proc. 6th Int. Conf. VLSI Design , pp. 132-135
    • Srinivas, M.1    Patnaik, L.2
  • 15
    • 0003998780 scopus 로고    scopus 로고
    • Learning to break things: Adaptive testing of intelligent controllers
    • T. Bäck, D. Fogel, and Z. Michalewicz, Eds. New York: IOP Publishing and Oxford Univ. Press, G3.4.
    • A. Schultz, J. Grefenstette, and K.D. Jong, “Learning to break things: Adaptive testing of intelligent controllers,” in The Handbook of Evolutionary Computation, T. Bäck, D. Fogel, and Z. Michalewicz, Eds. New York: IOP Publishing and Oxford Univ. Press, 1997, G3.4.
    • (1997) The Handbook of Evolutionary Computation
    • Schultz, A.1    Grefenstette, J.2    Jong, K.D.3
  • 17
    • 0032321263 scopus 로고    scopus 로고
    • Effect of noise on analog circuit testing
    • Monterey, CA,.
    • M.K. Iyer and M.L. Bushnell, “Effect of noise on analog circuit testing,” in Proc. 16th IEEE VLSI Test Symp, Monterey, CA, 1998, pp. 138-144.
    • (1998) Proc. 16th IEEE VLSI Test Symp , pp. 138-144
    • Iyer, M.K.1    Bushnell, M.L.2
  • 19
    • 33747356808 scopus 로고    scopus 로고
    • Automatic symbolic verification of embedded systems
    • R. Alur, T. Henzinger, and P.H. Ho, “Automatic symbolic verification of embedded systems,” IEEE Trans. Software Eng., vol. 22, no. 3, pp. 181-201, 1996.
    • (1996) IEEE Trans. Software Eng. , vol.22 , Issue.3 , pp. 181-201
    • Alur, R.1    Henzinger, T.2    Ho, P.H.3
  • 20
    • 0001403575 scopus 로고
    • Genetic algorithm for real parameter optimization
    • CA: Morgan Kaufmann,.
    • A. Wright, “Genetic algorithm for real parameter optimization,” in Foundations of Genetic Algorithms 1. San Mateo, CA: Morgan Kaufmann, 1991, pp. 105-218.
    • (1991) Foundations of Genetic Algorithms 1. San Mateo , pp. 105-218
    • Wright, A.1
  • 24
    • 0003994186 scopus 로고    scopus 로고
    • Stateflow, car simulation demo. [Online]. Available:http://www.mathworks.com/products/demos/stateflow/sfcar.html
    • Mathworks (2002), Stateflow, car simulation demo. [Online]. Available:http://www.mathworks.com/products/demos/stateflow/sfcar.html
    • (2002) Mathworks


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.