Efficient test set design for analog and mixed-signal circuits and systems

Proceedings of the Asian Test Symposium

Volumn , Issue , 1999, Pages 239-244

  Huynh, Sam ^a   Zhang, Jinyan ^a   Kim, Seongwon ^a   Devarayanadurg, Giri ^a   Soma, Mani ^a  

^a UNIVERSITY OF WASHINGTON   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

TEST PATTERN GENERATION;

ALGORITHMS; INTEGRATED CIRCUIT TESTING; MIXER CIRCUITS;

COMPUTER SOFTWARE SELECTION AND EVALUATION;

EID: 0033353202     PISSN: 10817735     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (11)

1. G. Devarayanadurg and M. Soma, "Dynamic Test Signal Design for Analog ICs," Proc. of ICCAD, pp. 627-629, 1995.
2. G. Devarayanadurg and M. Soma, "Analytical Fault Modeling and Static Test Generation for Analog ICs," Proc. ICCAD, pp.44-47, 1994.
3. J. Hou and A. Chatterjee, "CONCERT: A Concurrent Transient Fault Simulator for Non-Linear Analog Circuits," Proc. of ICCAD, pp. 384-391, 1998.
4. J. Hou and A. Chatterjee, "CONCERT: A Concurrent Fault Simulator for Analog Circuits," Proc. of the IMST Workshop, pp. 3-8, 1998.
5. S. D. Huynh, S. Kim, M. Soma, and J. Zhang, "Dynamic Test Set Generation for Analog Circuits and Systems," Proc. ATS 98, pp. 360-365, 1998.
6. S. D. Huynh, S. Kim, M. Soma, and J. Zhang, "Testability Analysis and Multi-Frequency ATPG for Analog Circuits and Systems," Proc. of ICCAD, pp. 376-383, 1998.
7. S. D. Huynh, M. Soma, and J. Zhang, "Analytical Testability Models for Mixed-Signal Circuits," 1998IWSTD, Digest of Papers, pp. 43-50, 1998.
8. B. Kaminska, K. Arabi, I. Bell, P. Goteti, J. L. Huertas, B. Kim, A. Rueda, and M. Soma, "Analog and Mixed-Signal Benchmark Circuits-First Release," Proc. of ITC, pp. 183-190, 1997.
9. R. Voorakaranam, S. Chakrabarti, J. Hou, A. Gomes, S. Cherubal, and A. Chatterjee, "Hierarchical Specification-Driven Analog Fault Modeling for Efficient Fault Simulation and Diagnosis," Proc. of ITC, pp. 903-912, 1997.
10. M. Ismail and T. Fiez, Analog VLSI Signal and Information Processing, McGraw-Hill, Chapter 12, "Design for Testability," 1994.
11. A. Pahwa and R. A. Rohrer, "Band Faults: Efficient approximations to fault bands for the simulation before diagnosis of linear circuits," IEEE Transactions on Circuits and Systems, Vol. CAS-29, pp. 81-88, 1982.