Effect of noise on analog circuit testing

Proceedings of the IEEE VLSI Test Symposium

Volumn , Issue , 1998, Pages 138-144

  Iyer, M K ^a   Bushnell, M L ^a  

^a RUTGERS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DECISION MAKING; FAST FOURIER TRANSFORMS; INTERFERENCE SUPPRESSION; SIMULATION; SPECTRUM ANALYSIS; SPURIOUS SIGNAL NOISE;

NOISE ROBUST TESTS;

INTEGRATED CIRCUIT TESTING;

EID: 0032321263     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)