Layer-by-layer analysis of surface reflectance anisotropy in semiconductors

Physical Review B - Condensed Matter and Materials Physics

Volumn 68, Issue 4, 2003, Pages

  Castillo, C ^a   Mendoza, Bernardo ^a   Schmidt, G ^b   Hahn, H ^b   Bechstedt, F ^b  

^a CENTRO DE INVESTIGACIONES EN ÓPTICA   (Mexico)

^b FRIEDRICH SCHILLER UNIVERSITY JENA   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ARTICLE; CALCULATION; GAS; MATHEMATICAL ANALYSIS; METHODOLOGY; MICROSCOPY; REFLECTOMETRY; SEMICONDUCTOR; SURFACE PROPERTY;

EID: 0042338727     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.68.041310     Document Type: Article

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