Characterization of ultra-violet-induced changes in planar waveguides

Journal of Optics A: Pure and Applied Optics

Volumn 5, Issue 4, 2003, Pages 335-340

  Fernando, H N J ^a   Canning, J ^b   Wosinski, L ^a   Jaskorzynska, B ^a   Dainese, M ^a  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b UNIVERSITY OF SYDNEY   (Australia)

Author keywords

Interfacial relaxation; Material dilation; Negative refractive index; Type IIa gratings

Indexed keywords

REFRACTIVE INDEX; SPECTROPHOTOMETERS; SURFACE TOPOGRAPHY; THIN FILMS;

INTERFACIAL RELAXATION;

OPTICAL WAVEGUIDES;

EID: 0042306400     PISSN: 14644258     EISSN: None     Source Type: Journal    
DOI: 10.1088/1464-4258/5/4/305     Document Type: Article

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