Analysis of color-center-related contribution to bragg grating formation in ge: SiO2 fiber based on a local kramers-kronig transformation of excess loss spectra

Applied Optics

Volumn 36, Issue 24, 1997, Pages 5923-5930

  Leconte, Bruno ^a   Xie, Wen Xiang ^a   Douay, Marc ^a   Bernage, Pascal ^a   Niay, Pierre ^a   Bayon, Jean François ^b   Delevaque, Eric ^b   Poignant, Hubert ^b  

^a UNIVERSITÉ DES SCIENCES ET TECHNOLOGIES DE LILLE   (France)

^b ORANGE LABS   (France)

Author keywords

Electronic speckle pattern interferometry; Index of refraction; Metrology; Temperature measurements; Tv holography

Indexed keywords

COLOR CENTERS; DIFFRACTION GRATINGS; EXCIMER LASERS; FOURIER TRANSFORMS; LIGHT ABSORPTION; LIGHT MODULATION; REFRACTIVE INDEX; SEMICONDUCTING GERMANIUM; SILICA; SPECTROSCOPY;

BRAGG GRATINGS; COMPUTERIZED ACQUISITION SYSTEM; GERMANIUM OXYGEN DEFECT CENTERS; KRAMERS-KRONIG ANALYSIS; REFRACTIVE INDEX MODULATION;

OPTICAL FIBERS;

EID: 0031210168     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.36.005923     Document Type: Article

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