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Volumn 47, Issue 11, 2003, Pages 1921-1926

Computational load pull simulations of SiC microwave power transistors

Author keywords

Load pull; MESFET; Microwave; Physical large signal modelling; SiC; Simulation; Time domain

Indexed keywords

ELECTRIC FIELDS; ELECTRIC POTENTIAL; MESFET DEVICES; SIGNAL PROCESSING; SILICON CARBIDE; TRANSISTORS;

EID: 0042229241     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(03)00251-X     Document Type: Article
Times cited : (15)

References (12)
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  • 3
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    • The importance of the gate charge formulation in large-signal PHEMT modelling
    • Mallavarpu R., Teeter D., Snow M. The importance of the gate charge formulation in large-signal PHEMT modelling. IEEE MTT-S. 1998;87.
    • (1998) IEEE MTT-S , pp. 87
    • Mallavarpu, R.1    Teeter, D.2    Snow, M.3
  • 4
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    • Principles of Nonlinear active device modelling for circuit simulation
    • Root D, Hughes B. Principles of Nonlinear active device modelling for circuit simulation. 32nd ARFTG Conference, 1988.
    • (1988) 32nd ARFTG Conference
    • Root, D.1    Hughes, B.2
  • 6
    • 0033694482 scopus 로고    scopus 로고
    • A computational load-pull system for evaluating RF and Microwave power amplifier technology
    • Loechelt G.H., Loechelt P.A. A computational load-pull system for evaluating RF and Microwave power amplifier technology. IEEE MTT-S Dig. 2000;465.
    • (2000) IEEE MTT-S Dig , pp. 465
    • Loechelt, G.H.1    Loechelt, P.A.2
  • 7
    • 0033099467 scopus 로고    scopus 로고
    • A cad-oriented non-linear model of SiC MESFET based on pulsed I - V, pulsed S -parameters measurement
    • Sirex D., Noblanc O., Barataud D., Chartier E., Brylinski C., Quere R. A cad-oriented non-linear model of SiC MESFET based on pulsed. I - V, pulsed S -parameters measurement IEEE Trans. ED-46:1999;580.
    • (1999) IEEE Trans , vol.ED-46 , pp. 580
    • Sirex, D.1    Noblanc, O.2    Barataud, D.3    Chartier, E.4    Brylinski, C.5    Quere, R.6
  • 8
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    • Comparison of SiC, GaAs, and Si RF MESFET power densities
    • Weitzel C.E. Comparison of SiC, GaAs, and Si RF MESFET power densities. IEEE Electron Dev. Lett. (16):1995;451.
    • (1995) IEEE Electron Dev Lett , Issue.16 , pp. 451
    • Weitzel, C.E.1
  • 10
    • 0032680907 scopus 로고    scopus 로고
    • Progress in the use of 4H-SiC semi-insulating wafers for microwave power MESFETs
    • Noblanc O., Arnodo C., Dua D., Chartier E., Brylinski C. Progress in the use of 4H-SiC semi-insulating wafers for microwave power MESFETs. Mater. Sci. Eng. 61-62:1998;339.
    • (1998) Mater Sci Eng , vol.61-62 , pp. 339
    • Noblanc, O.1    Arnodo, C.2    Dua, D.3    Chartier, E.4    Brylinski, C.5
  • 12
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    • A comparison between physical simulations and experimental results in 4H-SiC MESFETs with non-constant doping in the channel and buffer layers
    • Eriksson J., Rorsman N., Zirath H., Jonsson R., Wahab Q., Rudner S. A comparison between physical simulations and experimental results in 4H-SiC MESFETs with non-constant doping in the channel and buffer layers. Mater. Sci. Forum, Trans. Tech. Pub. (353-356):2001;699.
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    • Eriksson, J.1    Rorsman, N.2    Zirath, H.3    Jonsson, R.4    Wahab, Q.5    Rudner, S.6


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.