A circuit for measuring the gap voltage of a scanning tunneling microscope on a nanosecond time scale

Review of Scientific Instruments

Volumn 70, Issue 4, 1999, Pages 2049-2052

  Ochmann, M ^a   Munzer H J ^a   Boneberg, J ^a   Leiderer, P ^a  

^a UNIVERSITY OF KONSTANZ   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0042224572     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149709     Document Type: Article

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