Transient tunneling current in laser-assisted scanning tunneling microscopy

Journal of Applied Physics

Volumn 82, Issue 8, 1997, Pages 4115-4117

  Lyubinetsky, I ^a   Dohnalek Z ^a   Ukraintsev, V A ^a   Yates Jr , J T ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000284369     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.366251     Document Type: Article

References (23)

1. R. J. Hamers and K. Markert, Phys. Rev. Lett. 64, 1051 (1990).
2. Y. Kuk, R. S. Becker, P. J. Silverman, and G. P. Kochanski, Phys. Rev. Lett. 65, 456 (1990).
3. J. M. R. Weaver, L. M. Walpita, and H. K. Wickramasinghe, Nature (London) 342, 783 (1989).
4. L. Arnold, W. Krieger, and H. Walther, J. Vac. Sci. Technol. A 6, 466 (1988).
5. N. M. Amer, A. Skumanich, and D. Ripple, Appl. Phys. Lett. 49, 137 (1986).
6. L. Q. Qian and B. W. Wessels, Appl. Phys. Lett. 58, 1295 (1991).
7. S. Grafström, J. Kowalski, R. Neumann, O. Probst, and M. Wörtge, J. Vac. Sci. Technol. B 9, 568 (1991).
8. V. A. Ukraintsev and J. T. Yates, Jr., J. Appl. Phys. 80, 2561 (1996).
9. Z. Dohnalek, I. Lyubinetsky, and S. T. Yates, Jr., J. Vac. Sci. Technol. A 15, 1488 (1997).
10. N. M. Miskovsky, S. H. Park, J. He, and P. H. Cutler, J. Vac. Sci. Technol. B 11, 366 (1993).
11. J. B. Xu, K. Läuger, R. Möller, K. Dransfeld, and I. H. Wilson, Appl. Phys. A 59, 155 (1994).
12. D. G. Cahill and R. J. Hamers, J. Vac. Sci. Technol. B 9, 564 (1991); M. McEllistrem, G. Haase, D. Chen, and R. J. Hamers, Phys. Rev. Lett. 70, 2471 (1993).
13. D. G. Cahill and R. J. Hamers, J. Vac. Sci. Technol. B 9, 564 (1991); M. McEllistrem, G. Haase, D. Chen, and R. J. Hamers, Phys. Rev. Lett. 70, 2471 (1993).
14. V. A Ukraintsev and J. T. Yates, Jr., Surf. Sci. 346, 31 (1996).
15. R. Wiesendanger, Scanning Probe Microscopy and Spectroscopy: Methods and Applications (Cambridge University Press, Cambridge, 1994).
16. J. K. Gimzewski and R. Möller, Phys. Rev. B 36, 1284 (1987).
17. Y. Kuk and P. J. Silverman, J. Vac. Sci. Technol. A 8, 289 (1990).
18. M. Salmeron, D. F. Ogletree, C. Ocal, H.-C. Wang, G. Neubauer, and W. Kolbe, J. Vac. Sci. Technol. B 9, 1347 (1991).
19. Y. Hasegawa, I.-W. Lyo, and Ph. Avouris, Appl. Surf. Sci. 76/77, 347 (1994).
20. N. D. Lang, Phys. Rev. B 36, 8173 (1987); 37, 10395 (1988).
21. N. D. Lang, Phys. Rev. B 36, 8173 (1987); 37, 10395 (1988).
22. K. Hirose and M. Tsukada, J. Vac. Sci. Technol. B 12, 2164 (1994).
23. We could not use the sample-and-hold circuit (see Ref. 14) here, because a time of ∼20 s was used to average every point of the dependencies over 200 laser pulses.