Preamplifier for electric-current noise measurements at low temperatures

Review of Scientific Instruments

Volumn 67, Issue 8, 1996, Pages 2977-2980

  Birk, H ^a,b   Oostveen, K ^b   Schonenberger C ^a,b  

^a UNIVERSITY OF BASEL   (Switzerland)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0013445884     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147083     Document Type: Article

References (13)

1. See for example, Quantum Dynamics of Submicron Structures, edited by H. A. Cerdeira, B. Kramer, and G. Schön, NATO Advanced Science Institutes Series E, Vol. 291 (Kluwer, Dordrecht, 1995).
2. For a review, see D. V. Averin and K. K. Likharev, in Mesoscopic Phenomena in Solids, edited by B. L. Altshuler, P. A. Lee, and R. A. Webb (North-Holland, Amsterdam, 1991).
3. C. Schönenberger, H. van Houten, and H. C. Donkersloot, Europhys. Lett. 20, 249 (1992); C. Schönenberger, H. van Houten, H. C. Donkersloot, A. M. T. van der Putten, and L. G. L. Fokkink, Phys. Scr. T45, 289 (1992).
4. C. Schönenberger, H. van Houten, and H. C. Donkersloot, Europhys. Lett. 20, 249 (1992); C. Schönenberger, H. van Houten, H. C. Donkersloot, A. M. T. van der Putten, and L. G. L. Fokkink, Phys. Scr. T45, 289 (1992).
5. A. van der Ziel, Noise in Solid State Devices and Circuits (Wiley, New York, 1986).
6. H. Birk, M. J. M. de Jong, and C. Schönenberger, Phys. Rev. Lett. 75, 1610 (1995).
7. B. Michel, L. Novotny, and U. Dürig, Ultramicroscopy 42-44, 1647 (1992).
8. J. Imai and R. Flores, Rev. Sci. Instrum. 64, 3024 (1993).
9. A. T. Lee Rev. Sci. Instrum. 60, 3315 (1989); 64, 2373 (1993).
10. A. T. Lee Rev. Sci. Instrum. 60, 3315 (1989); 64, 2373 (1993).
11. Eltec Instruments Inc., Daytona Beach, FL.
12. We use the enhancement-mode MOSFET BSS83 (Philips).
13. P. Horowitz and W. Hill, The Art of Electronics (Cambridge University Press, Cambridge, 1989).