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Volumn 52, Issue 2, 1996, Pages 152-157

A method of electron diffraction intensity correction in combination with high-resolution electron microscopy

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001150793     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767395012682     Document Type: Article
Times cited : (29)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.