메뉴 건너뛰기




Volumn 85, Issue 12, 1999, Pages 8054-8059

Ultrashallow thermal donor formation in silicon by annealing in ambient oxygen

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0041708273     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370642     Document Type: Article
Times cited : (5)

References (30)
  • 1
    • 0003371040 scopus 로고
    • Oxygen in silicon
    • Academic, London
    • Oxygen in Silicon, edited by F. Shimura, Semiconductor and Semimetals, Vol. 42 (Academic, London, 1994).
    • (1994) Semiconductor and Semimetals , vol.42
    • Shimura, F.1
  • 8
    • 3743148289 scopus 로고    scopus 로고
    • Defects in semiconductors
    • ICDS-19, Trans Tech, Uetikon-Zuerich, Switzerland
    • R. C. Newman et al., Material Science Forum Series, Defects in Semiconductors, ICDS-19, Part 1 (Trans Tech, Uetikon-Zuerich, Switzerland, 1997), Vol. 258-263, p. 379.
    • (1997) Material Science Forum Series , vol.258-263 , Issue.1 PART , pp. 379
    • Newman, R.C.1
  • 19
    • 85034127343 scopus 로고    scopus 로고
    • The oxygen concentration profiles for the samples annealed in pure nitrogen are identical with those for the vacuum annealed samples and are, therefore, not included in Fig. 9
    • The oxygen concentration profiles for the samples annealed in pure nitrogen are identical with those for the vacuum annealed samples and are, therefore, not included in Fig. 9.
  • 20
    • 0042048756 scopus 로고
    • Diffusion of Nin Su
    • in Inspec, The Institute of Electrical Engineers, London
    • P. J. Ashby, Diffusion of Nin Su, in "Properties of Silicon", in (Inspec, The Institute of Electrical Engineers, London, 1988).
    • (1988) Properties of Silicon
    • Ashby, P.J.1
  • 28
    • 3743062557 scopus 로고    scopus 로고
    • Defects in semiconductors
    • ICDS-19, Trans Tech, Uetikon-Zuerich, Switzerland
    • T. Hallberg, J. L. Lindström, L. I. Murin, and V. P. Markevich, in Material Science Forum Series, Defects in Semiconductors, ICDS-19, Part 1 (Trans Tech, Uetikon-Zuerich, Switzerland, 1997), Vol. 258-263. p. 361.
    • (1997) Material Science Forum Series , vol.258-263 , Issue.1 PART , pp. 361
    • Hallberg, T.1    Lindström, J.L.2    Murin, L.I.3    Markevich, V.P.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.