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Volumn 210, Issue 2, 1998, Pages 519-525

Shallow thermal donors in silicon: The roles of Al, H, N, and point defects

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EID: 0032267215     PISSN: 03701972     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1521-3951(199812)210:2<519::AID-PSSB519>3.0.CO;2-H     Document Type: Article
Times cited : (34)

References (27)
  • 6
    • 0342943226 scopus 로고    scopus 로고
    • Early Stages of Oxygen Precipitation in Silicon, Ed. R. JONES, Kluwer Acad. Publ., Dordrecht
    • G.D. WATKINS, in: Early Stages of Oxygen Precipitation in Silicon, Ed. R. JONES, NATO ASI Series 3, Vol. 17, Kluwer Acad. Publ., Dordrecht 1996 (pp. 1-18).
    • (1996) NATO ASI Series 3 , vol.17 , pp. 1-18
    • Watkins, G.D.1
  • 9
    • 0007650224 scopus 로고    scopus 로고
    • Early Stages of Oxygen Precipitation in Silicon, Ed. R. JONES, Kluwer Acad. Publ., Dordrecht
    • C.A.J. AMMERLAAN, I.S. ZEVENBERGEN, YU. V. MARTYNOV, and T. GREGORKIEWICZ, in: Early Stages of Oxygen Precipitation in Silicon, Ed. R. JONES, NATO ASI Series 3, Vol. 17, Kluwer Acad. Publ., Dordrecht 1996 (pp. 61-82).
    • (1996) NATO ASI Series 3 , vol.17 , pp. 61-82
    • Ammerlaan, C.A.J.1    Zevenbergen, I.S.2    Martynov, Yu.V.3    Gregorkiewicz, T.4
  • 19
    • 0002826124 scopus 로고
    • Eds. J.W. CORBETT and G.D. WATKINS, Gordon & Breach, New York/London
    • A. BRELOT and J. CHARLEMAGNE, in: Radiation Effects in Semiconductors, Eds. J.W. CORBETT and G.D. WATKINS, Gordon & Breach, New York/London 1971 (pp. 161-170).
    • (1971) Radiation Effects in Semiconductors , pp. 161-170
    • Brelot, A.1    Charlemagne, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.