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Volumn 3, Issue , 2003, Pages 2105-2108

A scalable model for the substrate resistance in multi-finger RF MOSFETs

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC RESISTANCE; SUBSTRATES;

EID: 0041589571     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (20)

References (10)
  • 2
    • 0033221855 scopus 로고    scopus 로고
    • Accurate modeling and parameter extraction for MOS transistors valid up to 10 GHz
    • Nov.
    • S. H-M. Jen, C. C. Enz, D. R. Pehlke, M. Schröter, and B. J. Sheu, "Accurate modeling and parameter extraction for MOS transistors valid up to 10 GHz," IEEE Trans. Electron Devices, vol. 46, no. 11, pp. 2217-2227, Nov. 1999.
    • (1999) IEEE Trans. Electron Devices , vol.46 , Issue.11 , pp. 2217-2227
    • Jen, S.H.-M.1    Enz, C.C.2    Pehlke, D.R.3    Schröter, M.4    Sheu, B.J.5
  • 3
    • 0032140536 scopus 로고    scopus 로고
    • Extraction of high-frequency equivalent circuit parameters of submicron gate-length MOSFET's
    • Aug.
    • R. Sung, P. Bendix, and M. B. Das, "Extraction of high-frequency equivalent circuit parameters of submicron gate-length MOSFET's," IEEE Trans. Electron Devices, vol. 45, no. 8, pp. 1769-1775, Aug. 1998.
    • (1998) IEEE Trans. Electron Devices , vol.45 , Issue.8 , pp. 1769-1775
    • Sung, R.1    Bendix, P.2    Das, M.B.3
  • 5
    • 0036602363 scopus 로고    scopus 로고
    • A simple and analytical parameter extraction method of MOSFET for microwave modeling
    • June
    • I. Kwon, M. Je, K. Lee, and H. Shin, "A simple and analytical parameter extraction method of MOSFET for microwave modeling," IEEE Trans. Microwave Theory and Tech., vol. 50, no. 6, pp. 1503-1509, June 2002.
    • (2002) IEEE Trans. Microwave Theory and Tech. , vol.50 , Issue.6 , pp. 1503-1509
    • Kwon, I.1    Je, M.2    Lee, K.3    Shin, H.4
  • 6
    • 0000552355 scopus 로고    scopus 로고
    • A simple subcircuit extension of the BSIM3v3 model for CMOS RF design
    • Apr.
    • S. F. Tin, A. A. Osman, K. Mayaram, and C. Hu, "A simple subcircuit extension of the BSIM3v3 model for CMOS RF design," IEEE Jour. Solid-State Circ., vol. 35, no. 4, pp. 612-624, Apr. 2000.
    • (2000) IEEE Jour. Solid-state Circ. , vol.35 , Issue.4 , pp. 612-624
    • Tin, S.F.1    Osman, A.A.2    Mayaram, K.3    Hu, C.4
  • 7
    • 0036645960 scopus 로고    scopus 로고
    • A simple and accurate method for extracting substrate resistance of RF MOSFETs
    • July
    • J. Han, M. Je, and H. Shin, "A simple and accurate method for extracting substrate resistance of RF MOSFETs," IEEE Electron Device Lett., vol. 23, no. 7, pp. 434-436, July 2002.
    • (2002) IEEE Electron Device Lett. , vol.23 , Issue.7 , pp. 434-436
    • Han, J.1    Je, M.2    Shin, H.3
  • 8
    • 0036541717 scopus 로고    scopus 로고
    • Parameter extraction of accurate and scaleable substrate resistance components in RF MOSFETs
    • Apr.
    • Y. Cheng and M. Matloubian, "Parameter extraction of accurate and scaleable substrate resistance components in RF MOSFETs," IEEE Electron Device Lett., vol. 23, no. 4, pp.221-223, Apr. 2002.
    • (2002) IEEE Electron Device Lett. , vol.23 , Issue.4 , pp. 221-223
    • Cheng, Y.1    Matloubian, M.2
  • 9
    • 0033879027 scopus 로고    scopus 로고
    • MOS transistor modeling for RF IC design
    • Feb.
    • C. C. Enz and Y. Cheng, "MOS transistor modeling for RF IC design," IEEE Jour. Solid-State Circ., vol. 35, no. 2, pp.186-201, Feb. 2000.
    • (2000) IEEE Jour. Solid-state Circ. , vol.35 , Issue.2 , pp. 186-201
    • Enz, C.C.1    Cheng, Y.2
  • 10
    • 0034499762 scopus 로고    scopus 로고
    • On the high-frequency characteristics of substrate resistance in RF MOSFETs
    • Dec.
    • Y. Cheng and M. Matloubian, "On the high-frequency characteristics of substrate resistance in RF MOSFETs," IEEE Electron Device Lett., vol. 21, no. 12, pp. 604-606, Dec. 2000.
    • (2000) IEEE Electron Device Lett. , vol.21 , Issue.12 , pp. 604-606
    • Cheng, Y.1    Matloubian, M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.