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Volumn , Issue , 2000, Pages 352-355

Accurate a priori signal integrity estimation using a multilevel dynamic interconnect model for deep submicron VLSI design

Author keywords

[No Author keywords available]

Indexed keywords

DEEP SUB-MICRON; DEEP SUB-MICRON TECHNOLOGY; DELAY ESTIMATION; ELECTROMAGNETIC SIMULATION; INTERCONNECT MODELING; SIGNAL INTEGRITY; TIME EFFICIENCIES; VLSI DESIGN;

EID: 0041297627     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (9)
  • 1
    • 0031638412 scopus 로고    scopus 로고
    • The challenge of high-performance, deepsubmicron design in a turnkey ASIC environment
    • K. L. Shepard, "The challenge of high-performance, deepsubmicron design in a turnkey ASIC environment," in Proc. of IEEE ASIC conference, pp.183-186, 1998.
    • (1998) Proc. of IEEE ASIC Conference , pp. 183-186
    • Shepard, K.L.1
  • 3
    • 0008405647 scopus 로고    scopus 로고
    • A multilevel parasitic interconnect capacitance modeling and extraction for reliable VLSI on-chip clock delay evaluation
    • M. Lee, "A multilevel parasitic interconnect capacitance modeling and extraction for reliable VLSI on-chip clock delay evaluation," IEEE JSSC, vol.33, No.4, 1998
    • (1998) IEEE JSSC , vol.33 , Issue.4
    • Lee, M.1
  • 4
    • 0026626371 scopus 로고
    • Multilevel metal capacitance models for CAD design synthesis systems
    • J. H.Chen, J. Huang, L. Arledge, P.C.Li, and P. Yang, "Multilevel metal capacitance models for CAD design synthesis systems," IEEE EDL-13, pp.32-34, 1992
    • (1992) IEEE EDL-13 , pp. 32-34
    • Chen, J.H.1    Huang, J.2    Arledge, L.3    Li, P.C.4    Yang, P.5
  • 5
    • 0021472075 scopus 로고
    • An analysis of interconnect line capacitance and coupling for VLSI circuits
    • E. T. Lewis, "An analysis of interconnect line capacitance and coupling for VLSI circuits," Solid-State Electron., vol.27, pp.742-749, 1984
    • (1984) Solid-State Electron. , vol.27 , pp. 742-749
    • Lewis, E.T.1
  • 6
    • 0020704286 scopus 로고
    • Simple formulas for two-and three-dimensional capacitance
    • T. Sakura and K. Tamaru, " Simple formulas for two-and three-dimensional capacitance," IEEE Trans. Electron Devices, vol.ED-30, pp.183-185, 1983
    • (1983) IEEE Trans. Electron Devices , vol.ED-30 , pp. 183-185
    • Sakura, T.1    Tamaru, K.2
  • 7
    • 0000453553 scopus 로고    scopus 로고
    • Interconnect and substrate modeling and analysis: An overview
    • E. Chiprout, "Interconnect and substrate modeling and analysis: an overview," IEEE J. Solid-State Circuits, vol.33, no.9, pp.1445-1452, 1998
    • (1998) IEEE J. Solid-State Circuits , vol.33 , Issue.9 , pp. 1445-1452
    • Chiprout, E.1
  • 8
    • 0008363830 scopus 로고    scopus 로고
    • Noise margin constraint for interconnectivity in deep submicron low power and mixedsignal VLSI circuits
    • L.-R. Zheng, H. Tenhunen, "Noise margin constraint for interconnectivity in deep submicron low power and mixedsignal VLSI circuits," in Proc. ARVLSI, pp.123-136, 1999
    • (1999) Proc. ARVLSI , pp. 123-136
    • Zheng, L.-R.1    Tenhunen, H.2
  • 9
    • 0008389652 scopus 로고    scopus 로고
    • Global interconnect design for high speed ULSI and system-on-package
    • L.-R. Zheng, B. X. Li, H. Tenhunen, "Global interconnect design for high speed ULSI and system-on-package," in Proc. IEEE ASIC/SOC conference, pp.251-256, 1999
    • (1999) Proc. IEEE ASIC/SOC Conference , pp. 251-256
    • Zheng, L.-R.1    Li, B.X.2    Tenhunen, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.