Comparison of X-ray analysis methods used to determine the grain size and strain in nanocrystalline materials

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 79, Issue 8, 1999, Pages 1769-1786

  Tian, H H ^a   Atzmon, M ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040627935     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619908210391     Document Type: Article

References (40)

1. Balzar, D., 1992, J. appi. Crystallogr., 25, 559.
2. Balzar, D., and Popovic, S., 1996, J. appi, crystallogr., 29, 16.
3. Brown, A., and Edmonds, J. W., 1980, Adv. X-ray Anal., 23, 361.
4. Delhez, R., de Keijser, T. H., and Mittemeijer, E. J., 1982, Fresenius’Z. Anal. Chem., 312, 1.
5. Delhez, R., Mittemeijer, E. J., de Keijser, T. H., and Rozendaal, H. C. F., 1977, J, Phys. E: Sci. lnstrum., 10, 784.
6. Ergun, S., 1968, J. appi. Crystallogr., 1, 19.
7. Fecht, H. J., 1994, Nanophase materials, edited by G. C. Hadjipanayis and R. W. Siegel (Dordrecht Kluwer) p. 125.
8. Fougere, G. E., 1995, PhD Thesis, Northwestern University, Evanston, Illinois.
9. Gleiter, H., 1989, Prog. Mater. Sci., 33, 223.
10. Goodrich, D. M., and Atzmon, M., 1996, Mater. Sci. Forum, 225-227, 223.
11. Halder, N. C., and Wagner, C. N. J., 1966, Acta crystallogr. 20, 312.
12. Holzer, J. C., Birringer, R., Eckert, J., Krill, C. E., and Johnson, W. L., 1992, Mater. Res. Sci. Symp. Proc., 272, 283.
13. Klug, H. P., and Alexander, L. E., 1974, X-ray Diffraction Procedure for Polycrystalline and Amorphous Materials, second edition (New York: Wiley), chapter 9.
14. Krill, C. E., and Birringer, R., 1996, Mater. Sci. Forum, 225-227, 263
15. Krill, C. E., and Birringer, R., 1998, Phil. Mag. A, 77, 621.
16. Langford, J. I., Delhez, R., de Keijser, Th. H., and Mittemeijer, E. J., 1988, Aust. J. Phys., 41, 173.
17. Malow, T. R., and Koch, C. C., 1997, Acta mater., 45, 2177.
18. Munitz, A., Kimmel, G., Rawers, J. C., and Fields, R. J., 1997, Nanostruct. Mater., 8, 867.
19. Pradhan, S. K., Chakraborty, T., Gupta, S. P. Sen, Suryanarayana, C., Frefer, A., and Fores, F. H., 1995, Nanostruct. Mater., 5, 53.
20. Reimann, K., and Würschum, R., 1997, J. appi. Phys., 81, 7186.
21. Rothman, R. L., and Cohen, J. B., 1971, J. appi. Phys., 42, 971.
22. Sanders, P. G., Witney, A. B., Weertman, J. R., Valiev, R. Z., and Siegel, R. W., 1995, Mater. Sci. Eng., A204, 7.
23. Scherrer, P., 1918, Nachr. Göttingen, 2, 98.
24. Smithells, C. J., 1992, Smithells Metals Reference Book, seventh edition, edited by E. A., Bradnes and G. Brooks (London: Butterworths), p. 15-5.
25. Stokes, A. R., 1948, Proc. phys. Soc., 61, 382.
26. Stokes, A. R., and Wilson, A. J. C., 1944, Proc. phys. Soc., 56, 174.
27. Suryanarayana, C., 1995, Intr. Mater. Rev., 40, 41.
28. Tian, H. H., and Atzmon, M., 1999, Acta Mater., 47, 1255.
29. Ungár, T., and Borbély, A., 1996, Appl. Phys. Lett., 69, 3173.
30. Van Berkum, J. G. M., Vermeulen, A. C., Delhez, R., de Keijser, T. H and Mittemei-jer, E. J, 1994, J. appl. Crystallogr., 27, 345.
31. Wagner, C. N. J., 1966, Local Atomic Arrangements Studied by X-ray Diffraction, edited by J. B. Cohen and J. E. Hilliard (New York: Gordon and Breach), p. 219.
32. Wagner, C. N. J., and Aqua, E. N., 1964, Adv. X-ray Anal., 7, 46.
33. Wagner, C. N. J., Yang, E., and Boldrick, M. S., 1996, Nanostruct. Mater., 7, 1.
34. Warren, B. E., 1959, Prog. Metal Phys., 8, 147
35. Warren, B. E., 1969, X-ray Diffraction (Reading, Massachusetts: Addision-Wesley), chapter 13.
36. Warren, B. E and Averbach, B. L., 1950, J. appl. Phys., 21 595.
37. Weast, R. C., (editor), 1988, CRC Handbook of Chemistry and Physics, student edition (West Palm Beach, Florida: CRC Press), p. E-140.
38. Weissmüller, J., 1996, Synthesis and Processing of Nanocrystalline Power, edited by D. L. Bourell (Warrendale, Pennsylvania: Metallurgical Society of AIME), p. 3.
39. Wilkens, M., 1979, J. appl. Crystallogr., 12, 119.
40. Williamson, G. K., and Hall, W. H., 1953, Acta metal., 1, 22.