Distribution of internal strains in nanocrystalline Pd studied by x-ray diffraction

Journal of Applied Physics

Volumn 81, Issue 11, 1997, Pages 7186-7192

  Reimann, K ^a   Wurschum R ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 5844289173     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.365307     Document Type: Article

References (69)

1. Proceedings of the 2nd International Conference on Nanostructural Materials, Suttgart, Germany, 1994, edited by H.-E. Schaefer, R. Würschum, H. Gleiter, and T. Tsakalakos, Nanostruct. Mater. 6 (1995)
2. A. A. Nazarov, A. E. Romanov, and R. Z. Valiev, Nanostruct. Mater. 6, 775 (1995); A. A. Nazarov, Philos. Mag. A 69, 327 (1994).
3. A. A. Nazarov, A. E. Romanov, and R. Z. Valiev, Nanostruct. Mater. 6, 775 (1995); A. A. Nazarov, Philos. Mag. A 69, 327 (1994).
4. H. Kisker, Dissertation, Universität Stuttgart, 1995.
5. A. R. Stokes and A. J. C. Wilson, Proc. Phys. Soc. London 56, 174 (1994).
6. A. Kochendörfer, Z. Kristallogr. 105, 393 (1944).
7. A. Segmüller, Z. Metallkd. 54, 247 (1963).
8. J. A. Eastman, M. R. Fitzsimmons, and L. J. Thompson, Philos. Mag. B 66, 667 (1992).
9. C. E. Krill and R. Birringer, Philos. Mag. A (submitted).
10. J. Weissmüller, J. Löffler, and M. Kleber, Nanostruct. Mater. 6, 105 (1995).
11. J. Weissmüller, in Nanostructured Materials: Synthesis, Characterization, and Uses, edited by A. S. Edelstein and R. C. Cammarata (Institute of Physics, Bristol, 1996), p. 219
12. P. G. Sanders, A. B. Whitney, J. R. Weertman, R. Z. Valiev, and R. W. Siegel, Mater. Sci. Eng. A 204, 7 (1995).
13. B. E. Warren and B. L. Averbach, J. Appl. Phys. 21, 595 (1950).
14. W. H. Hall, Proc. Phys. Soc. London, Sec. A 62, 741 (1949).
15. H. P. Klug and L. E. Alexander, X-ray Diffraction Procedures for Polycrystalline and Amorphous Materials (Wiley, New York, 1974).
16. A. Taylor, X-Ray Metallography (Wiley, New York, 1961).
17. C. N. J. Wagner, in Local Atomic Arrangements Studied by X-Ray Diffraction, edited by J. B. Cohen and J. E. Milliard (The Metallurgical Society, Gordon and Breach Science, New York, 1966), p. 217.
18. B. E. Warren, Prog. Met. Phys. 8, 147 (1959).
19. 2〉s is inconsistent with the assumption of a Cauchy-shaped profile (see also Sec. III C).
20. A. Guinier, X-ray Diffraction (Freeman, San Francisco, 1963).
21. C. G. Granqvist and R. A. Buhrman, J. Appl. Phys. 47, 2200 (1976).
22. P. Feltham, Am. Math. Monthly 5, 97 (1957).
23. W. Parrish, in International Tables for Crystallography, edited by A. J. C. Wilson (Kluwer Academic, Dordrecht, 1992), Vol. C, p. 42.
24. -3 for normalized profiles; see, for example, J. Puerta and P. Martin, Appl. Opt. 20, 3923 (1981); 22, 19 (1983).
25. -3 for normalized profiles; see, for example, J. Puerta and P. Martin, Appl. Opt. 20, 3923 (1981); 22, 19 (1983).
26. R. Würschum and H.-E. Schaefer, in Ref. 10, p. 277.
27. R. Würschum, K. Reimann, and P. Farber, Def. Diff. Forum (in press).
28. A.P. Sutton and R.W. Balluffi, Interfaces in Crystalline Materials, Monographs on the Physics and Chemistry of Materials (Clarendon, Oxford, 1995).
29. Peak shifts Δs due to planar defects and specimen misalignment can be readily distinguished since the latter shift varies monotonously with increasing s in contrast to the fault-induced shift; see for example, Ref. 16.
30. K. Kimoto, J. Phys. Soc. Jpn. (N.Y.) 8, 762 (1953).
31. W. Straub (private communication).
32. F. W. Gayle and F. S. Biancaniello, Nanostruct. Mater. 6, 429 (1995).
33. L. E. Murr, Interfacial Phenomena in Metals and Alloys (Addison-Wesley, London, 1975).
34. size (see Ref. 16).
35. 2〉-values might be affected for l<4 nm by the background subtraction and the limited range of analysis and for l>15 nm by the deconvolution and the statistical noise.
36. M. A. Krivoglaz, Theory of X-Ray and Thermal-Neutron Scattering by Real Crystals (Plenum, New York, 1969).
37. 2 instead of s is assumed for Eq. (1), the conclusions drawn with respect to the orientation of the microstresses would qualitatively hold as well; (a)M. Wilkens, Phys. Status. Solidi 2, 693 (1962); (b) M. Wilkens, J. Appl. Cryst. 12, 119 (1979).
38. 2 instead of s is assumed for Eq. (1), the conclusions drawn with respect to the orientation of the microstresses would qualitatively hold as well; (a)M. Wilkens, Phys. Status. Solidi 2, 693 (1962); (b) M. Wilkens, J. Appl. Cryst. 12, 119 (1979).
39. J. A. Eastman, M. A. Beno, G. S. Knapp, and L. J. Thompson, Nanostruct. Mater. 6, 543 (1995).
40. J. Eckert, Y. R. Abe, Z. Fu, and W. L. Johnson, Mater. Res. Soc. Symp. Proc. 272, 271 (1992).
41. R. Würschum, S. Gruss, B. Gissibl, H. Natter, R. Hempelmann, and H.-E. Schaefer, Proceedings of the 3rd International Conference on Nanostructured Materials, Kona, HI, 1996, Nanostruct. Mater. (in press).
42. H. Natter, T. Krajewski, and R. Hempelmann, Ber. Bunsenges. Phys. Chem. 100, 55 (1996); (a) C. N. J. Wagner, E. Yang, and S. Boldrick, Nanostruct. Mater. 7, 1 (1996).
43. H. Natter, T. Krajewski, and R. Hempelmann, Ber. Bunsenges. Phys. Chem. 100, 55 (1996); (a) C. N. J. Wagner, E. Yang, and S. Boldrick, Nanostruct. Mater. 7, 1 (1996).
44. J. A. Eastman and M. R. Fitzsimmons, J. Appl. Phys. 77, 522 (1995).
45. R. Birringer, C. E. Krill, and M. Klingel, Philos. Mag. Lett. 72, 71 (1995).
46. A. Tschoepe, R. Birringer, and H. Gleiter, J. Appl. Phys. 71, 5391 (1992).
47. R. Würschum, W. Greiner, and H.-E. Schaefer. Nanostruct. Mater. 2, 55 (1993).
48. E. Kneller, Ferromagnetismus (Springer, Berlin, 1962).
49. R. Z. Valiev and R. Sh. Musalimov, Phys. Met. Metallogr. 78, 666 (1994).
50. A. A. Nazarov, A. E. Romanov, and R. Z. Valiev, Nanostruct. Mater. 4, 93 (1994).
51. M. Wilkens, Phys. Status Solidi A 2, 359 (1970).
52. G. Palumbo, U. Erb, and K. T. Aust, Scr. Metall. Mater. 24, 2347 (1990).
53. A. H. King, Mater. Sci. Forum 126-128, 221 (1993).
54. V. G. Gryaznov, M. Yu. Tanakov, and L. I. Trusov, J. Mater. Sci. 27, 4829 (1992).
55. C.-L. Liu, J. B. Adams, and R. W. Siegel, Nanostruct. Mater. 4, 265 (1995).
56. Huilong Zhu and R. S. Averback, Philos. Mag. Lett. 73, 27 (1996).
57. A. R. Stokes, K. J. Pascoe, and H. Lipson, Nature (London) 151, 137 (1943).
58. Ch. S. Smith and E. E. Stickley, Phys. Rev. 64, 191 (1943).
59. ij see, for example, Ref. 15.
60. P. Villars and L. D. Calvert, Handbook of Crystallographic Data for Intermetallic Phases (American Society for Metals, Metals Park, OH, 1991), Vol. 4.
61. S. R. Phillpot, D. Wolf, and H. Gleiter, J. Appl. Phys. 78, 847 (1995).
62. C. Solliard and M. Flueli, Surf. Sci. 156, 487 (1985).
63. K. Ohshima, S. Yatsuya, and J. Harada, J. Phys. Soc. Jpn. 50, 3071 (1981).
64. R. Lamber, N. Jaeger, and G. Schulz-Ekloff, Surf. Sci. 227, 15 (1990).
65. J. W. M. Jacobs and D. Schryvers, J. Catal. 103, 436 (1987).
66. B. Baranowski, S. Majchzrak, and T. B. Flangan, J. Phys. F 1, 258 (1971).
67. A. Tschoepe and R. Birringer, Philos. Mag. B 68, 223 (1993).
68. J. Trampenau, K. Bauszus, W. Petty, and U. Herr, Nanostruct. Mater. 6, 551 (1995).
69. J. A. Eastman, M. R. Fitzsimmons, and L. J. Thompson, Philos. Mag. Lett. 68, 335 (1993).