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Volumn 24, Issue 9, 2001, Pages 1-72

Transfer-field methods for electronic noise in submicron semiconductor structures

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0040435108     PISSN: 0393697X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Review
Times cited : (24)

References (112)
  • 21
  • 22
    • 0012104915 scopus 로고
    • KADOMTSEV B. B., Zh. Eksp. Teor. Fiz., 32 (1957) 943, (English translation: Sov. Phys. JETP, 5 (1957) 771).
    • (1957) Sov. Phys. JETP , vol.5 , pp. 771
  • 46
    • 0040795133 scopus 로고
    • IOP Publishing Ltd.
    • GHIONE G., ESSDERC'90 (IOP Publishing Ltd.) 1990, pp. 225-228.
    • (1990) ESSDERC'90 , pp. 225-228
    • Ghione, G.1
  • 66
    • 0040200757 scopus 로고
    • edited by NOUGIER J. P. (Elsevier, Amsterdam)
    • NOUGIER J. P., in III-V Microelectronics, edited by NOUGIER J. P. (Elsevier, Amsterdam) 1991, p. 183.
    • (1991) III-V Microelectronics , pp. 183
    • Nougier, J.P.1
  • 93
    • 0038244706 scopus 로고
    • edited by SAVELLI M., LECOY G. and NOUGIER J. P. (Elsevier Science Publishing)
    • NOUGIER J. P., Noise in Physical systems and 1/f Noise, edited by SAVELLI M., LECOY G. and NOUGIER J. P. (Elsevier Science Publishing) 1983, p. 153.
    • (1983) Noise in Physical Systems and 1/f Noise , pp. 153
    • Nougier, J.P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.