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Volumn 83, Issue 5, 1998, Pages 2610-2618
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Extension of the impedance field method to the noise analysis of a semiconductor junction: Analytical approach
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Author keywords
[No Author keywords available]
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Indexed keywords
DIFFERENTIAL EQUATIONS;
ELECTRIC FIELDS;
ELECTRIC IMPEDANCE;
FIELD EFFECT TRANSISTORS;
GREEN'S FUNCTION;
MATHEMATICAL MODELS;
NYQUIST DIAGRAMS;
SCHOTTKY BARRIER DIODES;
SEMICONDUCTOR DIODES;
SPURIOUS SIGNAL NOISE;
DRIFT DIFFUSION MODEL;
IMPEDANCE FIELD METHOD;
NOISE ANALYSIS;
POISSON EQUATIONS;
SEMICONDUCTOR JUNCTIONS;
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EID: 0032021722
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.367023 Document Type: Article |
Times cited : (15)
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References (15)
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