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Volumn 83, Issue 5, 1998, Pages 2619-2630

Local noise analysis of a Schottky contact: Combined thermionic-emission - Diffusion theory

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0000119667     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367024     Document Type: Article
Times cited : (14)

References (27)
  • 9
    • 0344592352 scopus 로고    scopus 로고
    • J. Appl. Phys. 82, 2349 (1997).
    • (1997) J. Appl. Phys. , vol.82 , pp. 2349
  • 12
    • 0032021722 scopus 로고    scopus 로고
    • J. Appl. Phys. 83, 2610 (1998).
    • (1998) J. Appl. Phys. , vol.83 , pp. 2610
  • 15
    • 56249129282 scopus 로고
    • edited by S. M. Sze World Scientific, Singapore
    • Reprinted in Semiconductor Devices: Pioneering Papers, edited by S. M. Sze (World Scientific, Singapore, 1991), pp. 414-427.
    • (1991) Semiconductor Devices: Pioneering Papers , pp. 414-427
  • 16
    • 0030290085 scopus 로고    scopus 로고
    • An extension of this boundary condition to the case of non-ideal metal-semiconductor contacts has been worked out in G. Gomila, A. Pérez-Madrid, and J. M. Rubí, Physica A 233, 208 (1996).
    • (1996) Physica A , vol.233 , pp. 208
    • Gomila, G.1    Pérez-Madrid, A.2    Rubí, J.M.3
  • 18
    • 0003652415 scopus 로고
    • Dover, New York
    • This reasoning may be made more rigorous by considering the nonequilibrium thermodynamics arguments. For a general formulation of the theory, see e.g.: S. R. de Groot and P. Mazur, Non-equilibrium Thermodynamics (Dover, New York, 1984).
    • (1984) Non-equilibrium Thermodynamics
    • De Groot, S.R.1    Mazur, P.2
  • 19
    • 0030736434 scopus 로고    scopus 로고
    • For its application to semiconductor systems, see G. Gomila and J. M. Rubí, Physica A 234, 851 (1997).
    • (1997) Physica A , vol.234 , pp. 851
    • Gomila, G.1    Rubí, J.M.2
  • 23
    • 85034169241 scopus 로고    scopus 로고
    • note
    • I=2qI as a shot noise. Actually, the genuine shot noise is related to the Poissonian ballistic electron flow like that occurred in vacuum-tube diodes (Ref. 9), or in ballistic semiconductor devices (Ref. 20). Here, this relation appears as a consequence of the (near-)exponential I-V characteristics under combined diffusive and thermionic-emission transport regimes, which are apparently not ballistic. To use the term "shot" to characterize the type of noise under this situation is not completely adequate.
  • 26
    • 85034172658 scopus 로고    scopus 로고
    • -1 where φ(0)=0 has been used
    • -1 where φ(0)=0 has been used.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.