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Volumn 76, Issue 22, 2000, Pages 3268-3270

Low-frequency noise in gate overlapped lightly doped drain polycrystalline silicon thin-film transistors

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Indexed keywords


EID: 0040363061     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.126602     Document Type: Article
Times cited : (6)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.