Avalanche-induced excess noise in polycrystalline silicon thin-film transistors

Applied Physics Letters

Volumn 74, Issue 1, 1999, Pages 108-110

  Dimitriadis, C A ^a   Kamarinos, G ^b   Brini, J ^b   Evangelou, E K ^c   Gueorguiev, V K ^d  

^a ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

^b Grenoble INP Phelma   (France)

^c UNIVERSITY OF IOANNINA   (Greece)

^d INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0043194304     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122966     Document Type: Article

References (10)

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