Surface analysis by highly charged ion based secondary ion mass Spectrometry

Physica Scripta T

Volumn 80, Issue A, 1999, Pages 73-75

  Schenkel, T ^a   Hamza, A V ^a   Barnes, A V ^a   Newman, M W ^a   Machicoane, G ^a   Niedermayer, T ^a   Hattass, M ^a   McDonald, J W ^a   Schneider, D H ^a   Wu, K J ^b   Odom, R W ^b  

^a LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^b CHARLES EVANS AND ASSOCIATES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040212939     PISSN: 02811847     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (15)

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