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Volumn 79, Issue 9, 2001, Pages 1273-1275

Binding energy of vacancy clusters generated by high-energy ion implantation and annealing of silicon

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Indexed keywords


EID: 0039567321     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1385192     Document Type: Article
Times cited : (22)

References (17)
  • 14
    • 0039437512 scopus 로고    scopus 로고
    • note
    • Since the drive-in anneal in this experiment was less than the time necessary to saturate the excess vacancy region with Au (Ref. 13), the amount of vacancies measured here is a lower limit.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.