Thermal oxide of polycrystalline silicon on steel foil as a thin-film transistor gate dielectric

Applied Physics Letters

Volumn 78, Issue 23, 2001, Pages 3729-3731

  Wu, Ming ^a   Wagner, Sigurd ^a  

^a Princeton University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038976379     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1377319     Document Type: Article

References (11)

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